XFEL diffraction: developing processing methods to optimize data quality
نویسندگان
چکیده
منابع مشابه
XFEL diffraction: developing processing methods to optimize data quality
Serial crystallography, using either femtosecond X-ray pulses from free-electron laser sources or short synchrotron-radiation exposures, has the potential to reveal metalloprotein structural details while minimizing damage processes. However, deriving a self-consistent set of Bragg intensities from numerous still-crystal exposures remains a difficult problem, with optimal protocols likely to be...
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ژورنال
عنوان ژورنال: Journal of Synchrotron Radiation
سال: 2015
ISSN: 1600-5775
DOI: 10.1107/s1600577514028203